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EXAM [ ine ] !

Revolutionizing Quality Control in Semiconductor Production

At NEXony, we’re committed to delivering cutting-edge solutions for the semiconductor industry. Our new EXAM platform is designed to take quality control to the next level, leveraging advanced optical inspection technologies to ensure the highest yield and lowest losses.

Why Quality Control Matters?

In semiconductor production, complex processes require frequent checks to ensure accuracy and precision. Our EXAM platform is engineered to address these challenges, providing:

  • Advanced Optical Inspection: Precise and reliable inspection technologies to detect defects and anomalies.
  • Increased Yield: By identifying issues early, you can minimize losses and maximize production efficiency.
  • Enhanced Quality: Our platform ensures that your products meet the highest standards of quality and reliability.

EXAM [ ine ] !

It´s modular!

Microscopic

Macroscopic

Edge

Discover Our New Generation of EXAM

Introducing our brand new generation of EXAM, a modular cluster tool designed for all-side inspection and review in semiconductor process control. EXAM offers:

Ultimate Flexibility: Tailor EXAM to your specific needs and applications.

Modular Design: Choose from various inspection modules and options to create your perfect solution.

The Solution that Adapts to Your Needs

With EXAM, we offer you a maximum level of flexibility and adaptability. Our modular solution enables you to meet your specific requirements: 

Customizable Inspection: Choose from various inspection modules, such as front and/or backside inspection, full wafer snapshot module, and edge inspection.

Individual Configuration: Each inspection module can be combined with a wide range of equipment options to perfectly tailor your solution.

Advanced Microscopy for precise Wafer Analysis

Our microscopic inspection module, EXAM_A, is designed to deliver exceptional results. With the ability to be equipped with up to 7 high-quality lenses, it enables simultaneous inspection of both sides of the wafer.

EXAM_A offers more than just typical microscope applications, such as CD measurement. You can also leverage additional features like:

Automated Scan Modules: Streamline your inspection process and increase efficiency.

High-Resolution Imaging: Get detailed insights into your wafer’s structure and defects.

Experience the Future of Microscopic Inspection!

The Big Picture!

Our EXAM_S Snapshot module is designed to provide comprehensive macroscopic images of your wafers. With state-of-the-art components, it generates high-quality images of full wafers under various observation angles and illumination setups.

AI-Powered Anomaly Detection

Take your inspection to the next level with our AI-powered anomaly detection capabilities. By training the system, you can automatically Identify Defects – quickly detect anomalies and defects, reducing inspection time and increasing efficiency.

Experience the Power of EXAM_S!

Edge Inspection Made Easy with EXAM_E

Take your wafer inspection to the next level with our EXAM_E edge inspection module. Designed to provide high-resolution images of wafer edges, it ensures a seamless inspection of the critical edge area.

Benefits of EXAM_E

Precise Edge Inspection: Get detailed, high-resolution images of wafer edges to detect defects and anomalies.

Streamlined Inspection: EXAM_E integrates seamlessly with your existing inspection process, making it easier to ensure wafer quality.

EXAM [ ine ] !

It´s modular!

Microscopic

Macroscopic

Edge

Discover Our New Generation of EXAM

Introducing our brand new generation of EXAM, a modular cluster tool designed for all-side inspection and review in semiconductor process control.

The Solution that Adapts to Your Needs

Our modular solution enables you to meet your specific requirements such as front and/or backside inspection, full wafer snapshot module, and edge inspection.

Advanced Microscopy for precise Wafer Analysis

Our microscopic inspection module, EXAM_A, is designed to deliver exceptional results. With the up to 7 high-quality lenses a simultaneous inspection of both sides of the wafer is possible.

The Big Picture!

Our EXAM_S Snapshot module is designed to provide comprehensive macroscopic images of your wafers. High-quality images of full wafers under various observation angles and illumination setups can be made.

Edge Inspection Made Easy with EXAM_E

Take your wafer inspection to the next level with our EXAM_E edge inspection module. Designed to provide high-resolution and a seamless inspection of the critical edge area.

What else can we do for you?

Development at it´s best

Expert Development Solutions for Cutting-Edge Technology

At NEXony, we don’t just stop at providing innovative products. Our team of experts is dedicated to delivering top-notch development solutions that harness the latest high-tech components and cutting-edge know-how.

What Sets Us Apart? 

Manufacturing excellence

Delivering Comprehensive Solutions from a Single Source

At Nexony we understand that the key to delivering exceptional solutions lies in the principle of “all from one hand.” This approach enables us to provide seamless integration, optimized processes, and unparalleled quality. As a trusted partner, we offer our extensive manufacturing expertise as a standalone service, tailored to meet the complex needs of our clients.

What can you expect from us?

What else can we do for you?

Expert Development Solutions

At NEXony, our team of experts delivers top-notch development solutions with cutting-edge know-how under harnessing the latest high-tech components…

What Sets Us Apart? 

What else can we do for you?

Manufacturing Excellence

Comprehensive solutions from a single source from prototype to medium size series with seamless integration and quality.